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Newsletter 2014

September 01, 2014

Subject :

The Essential Material for Quality-Related Professionals!

e-News@KEYENCE
A Must-see for Quality Assurance Professionals! A Digital Microscope That Can Automatically Count the Number of Foreign Substances
Are you using optical microscopes to perform particle analysis, a precise operation that takes time?
With the VHX-5000, you can automatically count the number of targets within the specified range and measure the area of these targets. You can also exclude unnecessary items and isolate overlapping items. We are certain that those individuals who perform particle analysis and who count items such as foreign substances, metal structures, and particles will benefit from this catalog.
Image Processing: Stain Tool
This is the fourth installment in a new series of technical guides that explain image processing techniques and methods.
This time, we have compiled a technical document in which we provide information on settings, operation methods, and the principles behind "Stain Tool", which is a feature of KEYENCE image inspection that has been continuously developed to meet a demand to detect all stains.
Damaged Light Curtains Causing Downtime?
The GL-R Safety Light Curtain Series provides unmatched versatility, functionality, and durability.
The GL-R Safety Light Curtain Series offers industrial machine guarding solutions for even the most challenging applications. The GL-R is built to withstand environments where impact and harsh environmental conditions are potential factors. It also includes important features like edge to edge protection, innovative wiring options, and simplified alignment tools. Check out the latest technology with the catalog!
Do Your Measurements Require Virtual Elements?
Learn how to simplify difficult measurements such as those requiring center-to-center lines or midlines with just a few clicks.
With the IM Series, anyone can perform even the most difficult inspection with just a few clicks of the mouse. We have selected the top 20 applications that require use of virtual elements that previously made these inspections difficult and prone to error. Learn how the IM solves these problems while saving you time and eliminating user errors!

Technical E-news

Learn the latest in sensors, vision systems, measuring instruments, laser markers and microscopes.