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          Newsletter 2017

          May 22, 2017

          Subject :

          Technical guidebook to Achieve Traceability

          e-News@KEYENCE
          Traceability
          Traceability is no longer a request, but a demand from many customers today. Using identification markings to achieve traceability is the most common application now. Learn more about it.
          100 Image Processing Tricks Based on Real Stable Detection Examples [Preprocessing Edition Vol. 2]
          ·Blur
          ·Edge extraction

          This guide will teach you about the types and effective ways to use image enhancement filters, such as those listed above, which process captured images so that they are easier to measure.
          Displacement Sensors Line Up
          Have you tried reflective or thrubeam type measurement system? These non-contact methods have allowed multi-point measurement to be performed with ease. Browse the line up here.
          New Full Spectrum Sensor
          Just released not long ago, the LR-W series has already captured many hearts. The new improvements include Full-spectrum Detection, High Power White LED and Auto Tuning.
          The 3-Seconds Measurement Legend
          The IM Series surpassed the conventional dimension measurement equipment to attain results in just a few seconds. There's no need to manually note down the measurement value too, it's all automatically recorded!
          Try Out the "One Click" Auto-measurement
          Using a pre-made template, we are now able to perform a fast auto-measurement using a microscope. If you need to get measurement from your observation, please feel free to check this out.
          Accurate Detection of Black and Metal Workpieces
          The LR-Z Series combines a CMOS image sensor with a laser light source. The 350,000 fold light power control function enables stable detection that is not affected by the color or angle of the target. Download the catalog for all the details.

          Technical E-news

          Learn the latest in sensors, vision systems, measuring instruments, laser markers and microscopes.

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