Newsletter 2018

March 19, 2018

Subject :: Introducing an Ultra-large, Wide-stage Measurement system!

Introducing an Ultra-large, Wide-stage Model!

With a stage six times larger than that of conventional products, it is possible to measure large products that were previously unmeasurable. Batch measurements are also possible by loading multiple measurement objects of the same shape onto the large stage.

A Vision Sensor That Stabilizes Previously Unstable Detections

Is it enough to perform conventional visual inspections, inspections using multiple sensors, and then image processing? The IV Series makes it possible to eliminate any unstable elements.

The Basics of Image Processing That You Can Read in Just 10 Minutes

Cameras, illumination, and lenses are all vital elements for image processing.
This guide contains information on all these elements, and reading it will provide you with all the basic knowledge you need to perform image processing.

Want to Improve Your Bottom Line by Introducing a Digital Microscope?

KEYENCE's digital microscopes help solve problems in a variety of industries and fields. This guide introduces the benefits provided by KEYENCE's digital microscopes that we discovered when interviewing our customers.

Unique Laser Marker Functions for Higher Productivity

Our laser marker communication functions have gotten even better! If you are looking to save time and effort and improve efficiency then this guide is for you. Learn about entering strings in multiple marking blocks with a single click and implementing control without ladder programming.

Detect ANY Change in Appearance!

The NEW Full-Spectrum LR-W Series solves the widest range of applications you have ever seen. Solve presence/absence applications, differentiate products with slight variations, detect registration marks, and verify color.

Laser Marker × Code Reader

The key to a successful traceability system is determining specifications that consider both marking and reading codes. KEYENCE can provide comprehensive suggestions for both processes.