Atomic Force Microscopes (AFM)
![](/Images/ss_microscope_glossary_ot_atomic_force_microscopes_001_2008228.jpg)
A type of scanning probe microscope that measures a target by moving a mechanical probe across the surface. These systems are capable of providing high-resolution data at the sub-nanometre level.
A type of scanning probe microscope that measures a target by moving a mechanical probe across the surface. These systems are capable of providing high-resolution data at the sub-nanometre level.