Fully Operational with Expanded Resources
Click for the latest on how KEYENCE is continuing to support our customers with quick delivery, off-site testing, virtual demos and more.

Position detection of wafer notches

Position detection of wafer notches

The vision system detects the rotational position of wafer notches.

The resolution of the 5 Mega pixel camera and the built-in algorithms of the Trend Edge Stain tool makes it possible to stably detect the notch and also output the position and dimensional data.


A 2 Mega-pixel camera was used to detect the position of the notch, but the repeatability of the camera was not stable. By implementing the XG Series system, a 5 Mega pixel high-speed camera and the new Trend Edge Stain tool, the notch was stably located.


Back to top

KEYENCE INDIA PVT. LTD. SKCL Triton Square, 1st Floor, No. C3 to C7,
Thiru-Vi-Ka Industrial Estate, Guindy, Chennai – 600032,
Tamil Nadu, India
Phone: 1-800-103-0090
E-mail: info@keyence.co.in
Career Opportunities: KEYENCE Career Site